JU, Chengru; JIANG, Xiaoxiao; WU, Jiang; NI, Chunhe. AI-Driven Vulnerability Assessment and Early Warning Mechanism for Semiconductor Supply Chain Resilience. Annals of Applied Sciences, [S. l.], v. 5, n. 1, 2024. Disponível em: http://annalsofappliedsciences.com/index.php/aas/article/view/11. Acesso em: 30 jun. 2025.