CHEN, Jingyi; ZHANG, Yingqi. Deep Learning-Based Automated Bug Localization and Analysis in Chip Functional Verification. Annals of Applied Sciences, [S. l.], v. 5, n. 1, 2024. Disponível em: http://annalsofappliedsciences.com/index.php/aas/article/view/13. Acesso em: 3 oct. 2025.